Defect-state engineering in a-Si:H: An effective tool for studying processes during light-induced degradation
Journal Article
(2006)
Author(s)
V Nadazdy (TU Delft - Electronic Components, Technology and Materials)
R Durny (External organisation)
M. Zeman (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:82612327-9957-4a80-bf72-d66775ed22cb
More Info
expand_more
expand_more
Publication Year
2006
Research Group
Electronic Components, Technology and Materials
Volume number
352
Pages (from-to)
1059-1063
No files available
Metadata only record. There are no files for this record.