Intensity Inhomogeneity Correction for Large Panoramic Electron Microscopy Images

Conference Paper (2025)
Authors

O. Dzyubachyk (Leiden University Medical Center)

Abraham J. Koster (Leiden University Medical Center)

Boudewijn P.F. Lelieveldt (Leiden University Medical Center, TU Delft - Pattern Recognition and Bioinformatics)

Research Group
Pattern Recognition and Bioinformatics
To reference this document use:
https://doi.org/10.1007/978-3-031-77786-8_5
More Info
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Publication Year
2025
Language
English
Research Group
Pattern Recognition and Bioinformatics
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. @en
Pages (from-to)
45-54
ISBN (print)
9783031777851
DOI:
https://doi.org/10.1007/978-3-031-77786-8_5
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

In various medical and biological modalities, in particular, electron microscopy (EM), visualization of large fields of view requires acquisition of multiple overlapping frames with their subsequent reconstruction into a single panoramic image. Such reconstruction process is hampered by several factors, including different intensity scaling and imperfect localization of the acquired frames, intensity inhomogeneity within each frame, and large content variability between different frames. This poses a significant challenge not only for visualization, but also for further quantification of such panoramic images. In this work, we present a simple yet efficient data-driven algorithm that improves reconstruction of the large panoramic views using a minimal set of assumptions. More precisely, our approach fully relies on the information from the overlap regions of the neighbouring frames. Such formulation results in a linear system of equations that can be solved numerically, when supported by proper constraints. We validated our approach on a large set of highly-diverse in-house EM panoramic views and demonstrated improved performance with respect to traditional metrics as well as network training capacity.

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