Orientation and Location Controlled Si Grains Through Combined MILC and µ-Czochralski Process
Conference Paper
(2007)
Author(s)
T Chen (TU Delft - Old - EWI Sect. ECTM)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Sect. ECTM
To reference this document use:
https://resolver.tudelft.nl/uuid:8b63010d-ef38-4ee8-b0bf-d5597808b07e
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Publication Year
2007
Research Group
Old - EWI Sect. ECTM
Bibliographical Note
NEO@en
Pages (from-to)
2011-2012
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