Interface roughness in Mo/Si multilayers

Journal article (2006)

Authors

I Nedelcu External organisation
RWE van de Kruijs External organisation
AE Yakshin External organisation
F.D. Tichelaar QN/High Resolution Electron Microscopy
E Zoethout External organisation
E Louis External organisation
H Enkisch External organisation
S Muellender External organisation
F Bijkerk External organisation
Research Group
QN/High Resolution Electron Microscopy
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Published Date

2006

Language

Undefined/Unknown

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Research Group

QN/High Resolution Electron Microscopy