Event-based reconstructions in Computational Microscopy
F.A. Rivera Sanchez (Advanced Research Center for Nanolithography, Amsterdam, TU Delft - ImPhys/Witte group)
Jacob Seifert (Universiteit Utrecht, Debye Institute)
A. Karpavicius (Advanced Research Center for Nanolithography, Amsterdam)
M. Gouder (Advanced Research Center for Nanolithography, Amsterdam, Vrije Universiteit Amsterdam)
S.M. Witte (TU Delft - ImPhys/Witte group, Advanced Research Center for Nanolithography, Amsterdam)
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Abstract
We present a maximum-likelihood estimation (MLE) framework tailored to event-driven detectors to perform computational image reconstruction and phase retrieval. Using Poissonian photon statistics, we built an event-based loss function that maximizes the probability of having the set of events and non-events given the initial parameters. Our loss function can be utilized in both optical and electron ptychography. We demonstrate experimental reconstructions using data acquired with a Timepix3 detector.
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