Surface oxide content examination of capping boron layers in UV photodetectors
Conference Paper
(2015)
Author(s)
Vahid Mohammadi (TU Delft - Electronic Components, Technology and Materials)
Padmakumar R. Ramachandra Rao (TU Delft - Electronic Instrumentation)
RWE van de Kruijs (External organisation)
S Nihtianova (TU Delft - Electronic Instrumentation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/DRC.2015.7175562
To reference this document use:
https://resolver.tudelft.nl/uuid:9453ab81-74b4-4394-b779-c535c6978585
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Publication Year
2015
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
73-74
ISBN (print)
978-1-4673-8134-5
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