Surface oxide content examination of capping boron layers in UV photodetectors

Conference paper (2015)

Authors

V. Mohammadi Electronic Components, Technology and Materials - EEMCS
P. Ramachandra Rao Electronic Instrumentation - EEMCS
RWE van de Kruijs External organisation
S. Nihtianova Electronic Instrumentation - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2015

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials