Surface oxide content examination of capping boron layers in UV photodetectors

Conference Paper (2015)
Authors

V. Mohammadi (TU Delft - Electronic Components, Technology and Materials)

P. Ramachandra Rao (TU Delft - Electronic Instrumentation)

RWE van de Kruijs (External organisation)

S. Nihtianova (TU Delft - Electronic Instrumentation)

Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://doi.org/10.1109/DRC.2015.7175562
More Info
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Publication Year
2015
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
73-74
ISBN (print)
978-1-4673-8134-5
DOI:
https://doi.org/10.1109/DRC.2015.7175562

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