Study of 3-MeV electron irradiation damage in amorphous silicon with TRMC
Conference Paper
(2004)
Author(s)
A Klaver (TU Delft - Electronic Components, Technology and Materials)
John M. Warman (TU Delft - Old - Section Radiation Chemistry)
MP de Haas (TU Delft - Old - Section Radiation Chemistry)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
RACMM Swaaij (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:946fb223-72f9-4fa9-9408-1c321c8dcc32
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Publication Year
2004
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
165-170
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