Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions
Conference Paper
(2011)
Author(s)
V Vera (TU Delft - Joining and Mechanical Behavior)
JM Westra (TU Delft - Photovoltaic Materials and Devices)
R.A.C.M.M. van Swaaij (TU Delft - Photovoltaic Materials and Devices)
Michael Janssen (TU Delft - Joining and Mechanical Behavior)
IJ Bennett (External organisation)
IM Richardson (TU Delft - Joining and Mechanical Behavior)
Research Group
Joining and Mechanical Behavior
DOI related publication
https://doi.org/10.1109/PVSC.2011.6186276
To reference this document use:
https://resolver.tudelft.nl/uuid:96ea5b2b-09f0-4aa6-94ab-fc402c6569f3
More Info
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Publication Year
2011
Language
English
Research Group
Joining and Mechanical Behavior
Pages (from-to)
1668-1673
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