Quantitative AFM-SECM analysis with conductive cantilevers
Conference Paper
(2008)
Author(s)
PLTM Frederix (External organisation)
PD Bosshart (External organisation)
M Chami (External organisation)
T Akiyama (External organisation)
NF de Rooij (External organisation)
U STAUFER (TU Delft - Micro and Nano Engineering)
A Engel (External organisation)
Research Group
Micro and Nano Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:973f5e2b-1dca-4324-a9c3-b5a95cfceff8
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Publication Year
2008
Language
English
Research Group
Micro and Nano Engineering
Bibliographical Note
NEO@en
Pages (from-to)
1-1
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