Advanced defect classification by smart sampling, based on sub-wavelength anisotropic scatterometry

More Info
expand_more
Publication Year
2018
Language
English
Research Group
QN/Kavli Nanolab Delft
Volume number
10585
ISBN (electronic)
9781510616622
DOI:
https://doi.org/10.1117/12.2297188

Abstract

We report on advanced defect classification using TNO's RapidNano particle scanner. RapidNano was originally designed for defect detection on blank substrates. In detection-mode, the RapidNano signal from nine azimuth angles is added for sensitivity. In review-mode signals from individual angles are analyzed to derive additional defect properties. We define the Fourier coefficient parameter space that is useful to study the statistical variation in defect types on a sample. By selecting defects from each defect type for further review by SEM, information on all defects can be obtained efficiently.

No files available

Metadata only record. There are no files for this record.