Analysis of the base-collector junction breakdown voltage in silicon-on-glass bipolar transistors
Conference Paper
(2006)
Author(s)
G Lorito (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Ch. Integrated Sensing Devices
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https://resolver.tudelft.nl/uuid:98b6abb5-668d-4153-a7c5-a161e58e56ad
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Publication Year
2006
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
534-537
ISBN (print)
90-73461-44-8
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