Analysis of the base-collector junction breakdown voltage in silicon-on-glass bipolar transistors

Conference paper (2006)

Authors

G. Lorito Old - EWI Ch. Integrated Sensing Devices
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Old - EWI Ch. Integrated Sensing Devices
Elektrotechniek Techniek
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Published Date

2006

Language

Undefined/Unknown

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Research Group

Old - EWI Ch. Integrated Sensing Devices