Failure during scratch testing of thick and thin CrN coatings examined using focused ion beam
Journal Article
(2005)
Author(s)
R Hoy (External organisation)
VGM Sivel (QN/High Resolution Electron Microscopy)
JD Kamminga (TU Delft - OLD Surface and Interface Engineering)
GCAM Janssen (TU Delft - OLD Surface and Interface Engineering)
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https://resolver.tudelft.nl/uuid:9956d0d6-d04c-4899-9c56-772d62a30aa6
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Publication Year
2005
Issue number
1-4
Volume number
200
Pages (from-to)
149-152
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