Failure during scratch testing of thick and thin CrN coatings examined using focused ion beam

Hoy, R; Sivel, VGM; Kamminga, J.D.; Janssen, GCAM

Failure during scratch testing of thick and thin CrN coatings examined using focused ion beam

Journal article (2005)

Authors

R Hoy External organisation

VGM Sivel

J.D. Kamminga OLD Surface and Interface Engineering

GCAM Janssen OLD Surface and Interface Engineering

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2005

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