Failure during scratch testing of thick and thin CrN coatings examined using focused ion beam

Journal Article (2005)
Author(s)

R Hoy (External organisation)

VGM Sivel (QN/High Resolution Electron Microscopy)

JD Kamminga (TU Delft - OLD Surface and Interface Engineering)

GCAM Janssen (TU Delft - OLD Surface and Interface Engineering)

More Info
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Publication Year
2005
Issue number
1-4
Volume number
200
Pages (from-to)
149-152

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