Orthodox etching of HVPE-grown GaN

The cloak of young woman seated at a Virginal: Vermeer or a later hand?

Cross-section transmission electron microscopy characterization of the near-surface structure of medical Nitinol superelastic tubing

Dark and Shiny: The discovery of Chromite in Bronze Age Faience

Crystallographic analysis of thin specimens

Failure during scratch testing of thick and thin CrN coatings examined using focused ion beam

Dielectric response of sputtered transition metal oxides

Anisotropic growth of chromium films during sputter deposition on substrates in planetary motion

Improving the adhesion between epoxy coatings and alumium substrates

Changes in epoxy-coated aluminium due to exposure to water

Using FIB sample preparation in the study of historical artefacts

Application of the dual-beam FIB/SEM to metals research

Cross section by focussed ion beam of in-situ induced phase transformed zones at grain boundaries in Cu3Au TEM foils

Presence of aluminium in a FIB prepared TEM specimen made in a blister

Application of the dual beam focussed ion beam for metaks research

Electron backscattering diffraction of FIB prepared thin specimens

Electron backscattering diffraction on FIB prepared thin specimens

Application of the Dual Beam FIB for crystallographic infection

Tensile stress in hard metal films

Focused ion beam in an electron microscope