Crystallographic analysis of thin specimens
Journal Article
(2005)
Author(s)
VGM Sivel (TU Delft - QN/High Resolution Electron Microscopy)
Frans D. Tichelaar (TU Delft - QN/High Resolution Electron Microscopy)
H Mohdadi (TU Delft - QN/High Resolution Electron Microscopy)
P.F.A. Alkemade (TU Delft - QN/High Resolution Electron Microscopy)
H. Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
QN/High Resolution Electron Microscopy
To reference this document use:
https://resolver.tudelft.nl/uuid:782cb730-78ee-4892-8c77-52f2abc57e4f
More Info
expand_more
expand_more
Publication Year
2005
Research Group
QN/High Resolution Electron Microscopy
Issue number
2
Volume number
218
Pages (from-to)
115-124
No files available
Metadata only record. There are no files for this record.