Orthodox etching of HVPE-grown GaN

Solutions to a proxomity effect in high resolution electron beam induced deposition

Cerenkov losses: A limit for bandgap determination and Kramers-Kronig analysis

Angular and local spectroscopic analysis to probe the vertical alignment of N-doped well-separated carbon nanotubes

Accuracy of the calculated unoccupied states in GaN phases as tested by high-resolution electron energy-loss spectroscopy

Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope

A TEM and electron energy loss spectroscopy (EELS) investigation of active and inactive silver particles for surface enhanced resonance Raman spectroscopy (SERRS)

High-resolution EELS investigation of the electronic structure of ilmenites

Evidence against a charge density wave on Bi

Electron energy loss spectra of C-60 and C-70 fullerenes

The role of Mn in the electronic structure of Ba3Ti2MnO9

Defects and electronic structure of GaN

Defect-selective etching of SiC

Changes in the electronic structure of cerium due to variations in close packing

Nanopipes in GaN: photo-etching and TEM study

Electron-energy-loss spectroscopy and X-ray absorption spectroscopy as complementary probes for complex f-electron metals: cerium and plutonium

Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory

Energy loss near edge structure study of fullerenes

Low loss EELS of Si/Ge devices: Si, Ge, SiO2 and HfO2

X-ray intensity from Au irradiated with 300 kV electrons at 15-100 K and as a function of crystal orientation