Application of the dual-beam FIB/SEM to metals research
Journal Article
(2004)
Author(s)
VGM Sivel (QN/High Resolution Electron Microscopy)
J van den Brand (TU Delft - OLD Surface and Interface Engineering)
WR Wang (QN/High Resolution Electron Microscopy)
H Mohdadi (QN/High Resolution Electron Microscopy)
F.D. Tichelaar (QN/High Resolution Electron Microscopy)
Paul F.A. Alkemade (QN/High Resolution Electron Microscopy)
Henny Zandbergen (QN/High Resolution Electron Microscopy)
To reference this document use:
https://resolver.tudelft.nl/uuid:4bb496f0-684c-4d52-b672-5f90118ffa24
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Publication Year
2004
Issue number
part 3
Volume number
214
Pages (from-to)
237-245
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