Ion-induced interface layer formation in W/Si and WRe/Si multilayers
Journal Article
(2005)
Author(s)
MJH Kessels (External organisation)
J Verhoeven (External organisation)
F.D. Tichelaar (TU Delft - QN/High Resolution Electron Microscopy)
F. Bijkerk (External organisation)
Research Group
QN/High Resolution Electron Microscopy
To reference this document use:
https://resolver.tudelft.nl/uuid:9a01b181-fe83-4022-92bc-413c067bb2f9
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Publication Year
2005
Research Group
QN/High Resolution Electron Microscopy
Issue number
1-3
Volume number
582
Pages (from-to)
227-234
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