Ion-induced interface layer formation in W/Si and WRe/Si multilayers

Kessels, MJH; Verhoeven, J; Tichelaar, F. D.; Bijkerk, F

Ion-induced interface layer formation in W/Si and WRe/Si multilayers

Journal article (2005)

Authors

MJH Kessels External organisation

J Verhoeven External organisation

F. D. Tichelaar QN/High Resolution Electron Microscopy

F Bijkerk External organisation

Research Group

QN/High Resolution Electron Microscopy

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Published Date

2005

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Research Group

QN/High Resolution Electron Microscopy

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