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MJH Kessels
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Authored
4 records found
Determination of in-depth density profiles of multilayer structures
Journal article -
MJH Kessels
,
F Bijkerk
,
F.D. Tichelaar
,
J Verhoeven
Ion beam induced intermixing of interface structures in W/Si multilayers
Journal article -
MJH Kessels
,
J Verhoeven
,
AE Yakshin
,
F.D. Tichelaar
,
F Bijkerk
Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors
Journal article -
MJH Kessels
,
J Verhoeven
,
F.D. Tichelaar
,
F Bijkerk
Ion-induced interface layer formation in W/Si and WRe/Si multilayers
Journal article -
MJH Kessels
,
J Verhoeven
,
F.D. Tichelaar
,
F Bijkerk