Characterization of precipitation in Al-Cu thin films by DSC and X-ray diffraction analysis.
Book Chapter
(1999)
Author(s)
JP Lokker (TU Delft - QN/Fysics of NanoElectronics)
A Böttger (External organisation)
G.C.A.M. Janssen (TU Delft - OLD Metals Processing, Microstructures and Properties)
S Radelaar (TU Delft - OLD Metals Processing, Microstructures and Properties)
Research Group
QN/Fysics of NanoElectronics
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https://resolver.tudelft.nl/uuid:9bfaebc8-1801-41b5-bf85-cf9ff22cbb33
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Publication Year
1999
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
471-476
ISBN (print)
1-55899-471-8
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