14×14 beams in a scanning electron microscope

Conference Paper (2009)
Author(s)

A. Mohammadi Gheidari (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)

P. Kruit (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)

Research Group
ImPhys/Microscopy Instrumentation & Techniques
DOI related publication
https://doi.org/10.1109/IVNC.2009.5271608 Final published version
More Info
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Publication Year
2009
Language
English
Research Group
ImPhys/Microscopy Instrumentation & Techniques
Pages (from-to)
183-184
Publisher
IEEE
Downloads counter
14
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Abstract

In this paper, the multi-beam source (MBS) unite is analyzed and the experimental results are presented. The basic concept in the MBS is that the broad beam of a high brightness Schottky source is split up into multiple sub-beams by an aperture array (AA). The AA is a silicon wafer with 100 holes and together with two macro electrodes acts as an aperture lens array (ALA) to focus each beam individually on to the blanker array (BA).

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