Parameter sensitivity study of cure-dependent underfill properties on flip chip failures
Conference Paper
(2002)
Author(s)
D Yang (TU Delft - Dynamics of Micro and Nano Systems)
GQ Zhang (External organisation)
W van Driel (External organisation)
J. Janssen (External organisation)
HJL Bressers (External organisation)
L.J. Ernst (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:9e1513e3-7b29-400f-b374-a8072a9b264b
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Publication Year
2002
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
865-872
ISBN (print)
0-7803-7430-4
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