Structural and electro-optical properties of thin silicon films deposited in the protocrystalline growth regime
Conference Paper
(2005)
Author(s)
G van Elzakker (TU Delft - Electronic Components, Technology and Materials)
Frans Tichelaar (QN/High Resolution Electron Microscopy)
M. Zeman (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:9ef1151c-783f-466a-9de3-83b9f957e1aa
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-5
ISBN (print)
90-73461-50-2
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