Structural and electro-optical properties of thin silicon films deposited in the protocrystalline growth regime

Conference paper (2005)

Authors

G van Elzakker Electronic Components, Technology and Materials - EEMCS
F.D. Tichelaar QN/High Resolution Electron Microscopy
M. Zeman Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2005

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials