Analyzing Angle-Gather Spectograms: Going Beyond Seismic Resolution
A. Karimzadanzabi (TU Delft - Applied Geophysics and Petrophysics)
A. Cuesta Cano (TU Delft - Applied Geology)
D. Verschuur (TU Delft - Applied Geophysics and Petrophysics)
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Abstract
This extended abstract discusses a novel approach to identify geological sub-seismic scale features using angle-gather spectrograms. Traditional seismic methods face challenges in identifying fine scale geological structures, especially in sublayers thinner than about 1/10 of the wavelength. This paper introduces the use of spectrogram analysis on angle gathers, to capture local spectrum information which is not visible and distinguishable in the reflectivity image and angle gathers themselves. The authors apply this technique to simulated seismic data for a range of basic geological scenarios, extracting spectrograms for each incident angle within angle gathers. The analysis explores the impact of density, velocity variations, layer number and layer thickness on spectrogram patterns, providing insights into their effectiveness for computer vision-related research. The study aims to rejuvenate the utilization of spectrograms for revealing hidden geological structures beyond standard seismic resolution.