A new extraction technique for the series resistance of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters

Cuoco, V; Neo, WCE; de Vreede, Leonardus Cornelis Nicolaas; de Graaff, HC; Nanver, L.K.; Wu, HC; Jos, HFF; Burghartz, JN

A new extraction technique for the series resistance of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters

Conference paper (2004)

Authors

V Cuoco Old - EWI Ch. Integrated Sensing Devices

WCE Neo Old - EWI Ch. Integrated Sensing Devices

Leonardus Cornelis Nicolaas de Vreede Old - EWI Ch. Integrated Sensing Devices

HC de Graaff Old - EWI Ch. Integrated Sensing Devices

L.K. Nanver Electronic Components, Technology and Materials

HC Wu Old - EWI Ch. Integrated Sensing Devices

HFF Jos External organisation

JN Burghartz Old - EWI Ch. Integrated Sensing Devices

Research Group

Old - EWI Ch. Integrated Sensing Devices

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Published Date

2004

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Research Group

Old - EWI Ch. Integrated Sensing Devices

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