A new extraction technique for the series resistance of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters

V Cuoco (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

WCE Neo (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

L.C.N. de Vreede (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

HC de Graaff (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

Lis Nanver (TU Delft - Electronic Components, Technology and Materials)

HC Wu (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

HFF Jos (External organisation)

JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)