A new extraction technique for the series resistance of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters

Conference paper (2004)

Authors

V Cuoco Old - EWI Ch. Integrated Sensing Devices

WCE Neo Old - EWI Ch. Integrated Sensing Devices

L.C.N. de Vreede Old - EWI Ch. Integrated Sensing Devices

HC de Graaff Old - EWI Ch. Integrated Sensing Devices

L.K. Nanver Electronic Components, Technology and Materials -

HC Wu Old - EWI Ch. Integrated Sensing Devices

HFF Jos External organisation

JN Burghartz Old - EWI Ch. Integrated Sensing Devices

Research Group

Old - EWI Ch. Integrated Sensing Devices

More Info

expand_more

To reference this document use:

http://resolver.tudelft.nl/uuid:a2544b0d-46f8-4163-9eb2-f5f6d11aaeac

Published Date

2004

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - EWI Ch. Integrated Sensing Devices