Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

Nadazdy, V; Durny, R; Thurzo, I; Pincik, E; Nishida, A; Shimizu, J; Kumeda, M; Shimizu, T

Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

Journal article (2002)

Authors

V Nadazdy Electronic Components, Technology and Materials

R Durny External organisation

I Thurzo External organisation

E Pincik External organisation

A Nishida External organisation

J Shimizu External organisation

M Kumeda External organisation

T Shimizu External organisation

Research Group

Electronic Components, Technology and Materials

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2002

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Research Group

Electronic Components, Technology and Materials

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