Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

Journal article (2002)

Authors

V Nadazdy Electronic Components, Technology and Materials - EEMCS
R Durny External organisation
I Thurzo External organisation
E Pincik External organisation
A Nishida External organisation
J Shimizu External organisation
M Kumeda External organisation
T Shimizu External organisation
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2002

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials