Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon
Journal Article
(2002)
Author(s)
V Nadazdy (TU Delft - Electronic Components, Technology and Materials)
R Durny (External organisation)
I Thurzo (External organisation)
E Pincik (External organisation)
A Nishida (External organisation)
J Shimizu (External organisation)
M Kumeda (External organisation)
T Shimizu (External organisation)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:a5f3fbcb-9487-4482-a1b3-2e3cab5946d4
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Publication Year
2002
Research Group
Electronic Components, Technology and Materials
Issue number
19
Volume number
66
Pages (from-to)
195211-1-195211-8
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