In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy
Journal Article
(2007)
Author(s)
HB Heersche (TU Delft - QN/Mol. Electronics & Devices)
G Lientschnig (External organisation)
K.M. O'Neill (TU Delft - QN/Mol. Electronics & Devices)
H. S J van der Zant (TU Delft - QN/Mol. Electronics & Devices)
Henny Zandbergen (QN/High Resolution Electron Microscopy)
Research Group
QN/Mol. Electronics & Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:a7b39097-7eb6-4f29-9ce7-d805fcc12387
More Info
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Publication Year
2007
Research Group
QN/Mol. Electronics & Devices
Issue number
7
Volume number
91
Pages (from-to)
72107-1-72107-3
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