Sensitivity computation of interconnect capacitances with respect to geometric parameters
Conference Paper
(2008)
Author(s)
Y. Bi (TU Delft - Old - EWI Sect. Circuits and Systems)
KJ van der Kolk (TU Delft - Signal Processing Systems)
D. Ioan (External organisation)
N.P. van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Old - EWI Sect. Circuits and Systems
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Publication Year
2008
Research Group
Old - EWI Sect. Circuits and Systems
Pages (from-to)
1-4
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