Protection Testing for Multiterminal High-Voltage dc Grid
Procedures and Assessment
Zhou Liu (Aalborg University)
Seyed Sattar Mirhosseini (Iran University of Science and Technology)
Marjan Popov (TU Delft - Intelligent Electrical Power Grids)
Yash Audichya (ABB (Sweden))
Daniele Colangelo (École Polytechnique Fédérale de Lausanne)
Sadegh Jamali (Iran University of Science and Technology)
Peter Palensky (TU Delft - Intelligent Electrical Power Grids)
Weihao Hu (University of Electronic Science and Technology of China)
Zhe Chen (Aalborg University)
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Abstract
eAssessment The application of multiterminal (MT), high-voltage dc (HVdc) (MTdc) grid technology requires test procedures for the operation and implementation of the protection solutions. The test procedures are usually derived from experience and from extensive measurement data, which, at present, are still not widely available. Based on a hardware-inthe- loop (HIL) method, advanced dc protection testing strategies, utilizing existing experience for ac grids and requirements for MTdc grids, may overcome this gap.