VUV performance characterization of a silicon based ultrashallow junction photodiode
Conference Paper
(2010)
Author(s)
L. Shi (TU Delft - Electronic Instrumentation)
S. Nihtianova (TU Delft - Electronic Instrumentation)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
U Krothc A (External organisation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:aaaffd16-9989-40a4-9e51-e3b75437b593
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Publication Year
2010
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
158-161
ISBN (print)
978-90-73461-67-3
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