Study of inverse Ni-based photonic crystal using the microradian X-ray diffraction

Journal article (2010)

Authors

A. V. Vasilieva Petersburg Nuclear Physics Institute (PNPI)
Natalia A. Grigoryeva St. Petersburg State University
A. A. Mistonov St. Petersburg State University
N. A. Sapoletova Chemistry Faculty of M. V. Lomonosov Moscow State University
Kirill S. Napolskii Chemistry Faculty of M. V. Lomonosov Moscow State University
Andrey A. Eliseev Chemistry Faculty of M. V. Lomonosov Moscow State University
Alexey V. Lukashin Chemistry Faculty of M. V. Lomonosov Moscow State University
Yu D. Tretyakov Chemistry Faculty of M. V. Lomonosov Moscow State University
W.G. Bouwman RST/Neutron and Positron Methods in Materials - AS
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Research Group
RST/Neutron and Positron Methods in Materials (AS) (TU Delft)
Copyright: © 2010 A. V. Vasilieva, N. A. Grigoryeva, A. A. Mistonov, N. A. Sapoletova, K. S. Napolskii, A. A. Eliseev, A. V. Lukashin, Yu D. Tretyakov, W.G. Bouwman, More Authors
DOI
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https://doi.org/10.1088/1742-6596/247/1/012029
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Published Date

2010

Language

English

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Faculty

Applied Sciences

Department

RST/Radiation, Science and Technology

Research Group

RST/Neutron and Positron Methods in Materials

Abstract

Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 650 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length L long is 3.4 0.2 μm, and the structure mosaic is of order of 10°.