Metal patterning on high topography surface for 3D RF devices fabrication

Journal Article (2004)
Author(s)

NP Pham (TU Delft - Electronic Components, Technology and Materials)

E Boellaard (TU Delft - Electronic Components, Technology and Materials)

W.H.A. Wien (TU Delft - Electronic Components, Technology and Materials)

LDM van den Brekel (External organisation)

JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

Pasqualina M Sarro (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
More Info
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Publication Year
2004
Research Group
Electronic Components, Technology and Materials
Volume number
115
Pages (from-to)
557-562

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