Yield Estimation of a Memristive Sensor Array

Abstract

This paper proposes a method to calculate the yield of a memristor based sensor array considered as the probability that the chip provides acceptable sensing results when the array is affected by manufacturing defects. The modeling is based on a Markov Chain approach, in which each state represents an operating chip configuration and the state transitions take into account manufacturing defects. The proposed method is applicable to evaluate the yield with different fault models to achieve the comparative yield obtained by several redundancy allocations.