Fast statistical analysis of RC nets subject to manufacturing variabilities
Conference Paper
(2011)
Author(s)
Y Bi (TU Delft - Signal Processing Systems)
KJ van der Kolk (TU Delft - Signal Processing Systems)
JF Villena (External organisation)
LM Silveira (External organisation)
Nick van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
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https://resolver.tudelft.nl/uuid:b0ca0702-7a2b-4680-9bd1-325f3b9431fb
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Publication Year
2011
Language
English
Research Group
Signal Processing Systems
Pages (from-to)
1-6
ISBN (print)
978-3-9810801-7-9
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