Optimization of RF- and DC sputtered Nb TiN films for integration with Nb-based SIS junction.
Journal Article
(1999)
Author(s)
N Iossad (TU Delft - QN/Fysics of NanoElectronics)
BD Jackson (TU Delft - QN/Fysics of NanoElectronics)
TM Klapwijk (TU Delft - QN/Fysics of NanoElectronics)
SN Polyakov (External organisation)
P Dimitriev (External organisation)
JR Gao (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:b26ad536-d605-4463-87ba-3c3e7bf33fcf
More Info
expand_more
expand_more
Publication Year
1999
Research Group
QN/Fysics of NanoElectronics
Issue number
2
Volume number
9
Pages (from-to)
1716-1719
No files available
Metadata only record. There are no files for this record.