In situ TEM electrical measurements of semiconductor and metal nanowires
Doctoral Thesis
(2016)
Author(s)
M. Neklyudova (TU Delft - QN/Zandbergen Lab)
Research Group
QN/Zandbergen Lab
Copyright
© 2016 M. Neklyudova
To reference this document use:
https://doi.org/10.4233/uuid:b3696080-152a-4f00-9be7-4eb139c05ab4
More Info
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Publication Year
2016
Language
English
Copyright
© 2016 M. Neklyudova
Research Group
QN/Zandbergen Lab
ISBN (print)
9789085932567
Reuse Rights
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.