Location and Orientation Control of Si Grains Through Combined MILC and ¿-Czochralski process

Conference paper (2007)

Authors

T Chen Old - EWI Sect. ECTM
R. Ishihara Electronic Components, Technology and Materials - EEMCS
JW Metselaar Electronic Components, Technology and Materials - EEMCS
C.I.M. Beenakker Electronic Components, Technology and Materials - EEMCS
Research Group
Old - EWI Sect. ECTM
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Published Date

2007

Language

Undefined/Unknown

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Research Group

Old - EWI Sect. ECTM