Location and Orientation Control of Si Grains Through Combined MILC and ¿-Czochralski process
Conference Paper
(2007)
Author(s)
T Chen (TU Delft - Old - EWI Sect. ECTM)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Sect. ECTM
To reference this document use:
https://resolver.tudelft.nl/uuid:b3f5a26c-9131-4de3-8365-bde766539f0c
More Info
expand_more
expand_more
Publication Year
2007
Research Group
Old - EWI Sect. ECTM
Pages (from-to)
271-273
No files available
Metadata only record. There are no files for this record.