Coulomb interactions in sharp tip pulsed photo field emitters
Ben Cook (TU Delft - ImPhys/Charged Particle Optics)
P Kruit (TU Delft - ImPhys/Charged Particle Optics)
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Abstract
Photofield emitters show great potential for many single electron pulsed applications. However, for the brightest pulses > 10 11 A / (m 2 sr V), our simulations show that Poisson statistics and stochastic Coulomb interactions limit the brightness and increase the energy spread even with an average of a single electron per pulse. For the systems, we study we find that the energy spread is probably the limiting factor for most applications.
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