Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices
Doctoral Thesis
(2011)
Author(s)
IS Irobi (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:b6d508d1-6c9f-404e-8616-5d40039b8ed0
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Publication Year
2011
Language
English
Research Group
Computer Engineering
ISBN (print)
978-90-72298-22-5
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