Risk assessment of fixed defects in GIS under different voltage wave shapes
Conference Paper
(2005)
Author(s)
S. Meijer (OLD High-Voltage Technology and Management)
E. Gulski (OLD High-Voltage Technology and Management)
Johan Smit (OLD High-Voltage Technology and Management)
AJLM Kanters (External organisation)
OLD High-Voltage Technology and Management
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Publication Year
2005
OLD High-Voltage Technology and Management
Bibliographical Note
Editor onbekend JH@en
Pages (from-to)
1-4
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