Nanometer-Scale Chemical Surface Analysis by Scanning (Tunnelling) Atom Probes
Journal Article
(2002)
Author(s)
PFA Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
NN Gribov (External organisation)
Research Group
Old - sect Electronic Materials (NS/EM)
To reference this document use:
https://resolver.tudelft.nl/uuid:b7a21c73-7629-4e40-90cc-417b31295e0e
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Publication Year
2002
Research Group
Old - sect Electronic Materials (NS/EM)
Volume number
138
Pages (from-to)
195-206
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