Nanometer-Scale Chemical Surface Analysis by Scanning (Tunnelling) Atom Probes

Journal article (2002)

Authors

P.F.A. Alkemade Old - sect Electronic Materials (NS/EM)
NN Gribov External organisation
Research Group
Old - sect Electronic Materials (NS/EM)
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Published Date

2002

Language

Undefined/Unknown

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Research Group

Old - sect Electronic Materials (NS/EM)