Electrothermal stability of bipolar transistors at medium and high-current operation regimes
Conference Paper
(2005)
Authors
N Nenadovic (TU Delft - Electronic Components, Technology and Materials)
WCE Neo (Old - EWI Ch. Integrated Sensing Devices)
X. Liu (External organisation)
Y Lin (External organisation)
LCN de Vreede (Old - EWI Ch. Integrated Sensing Devices)
V d' Alessandro (External organisation)
LE Larson (Old - EWI Ch. Integrated Sensing Devices)
M Spirito (Old - EWI Ch. Integrated Sensing Devices)
L. La Spina (TU Delft - Electronic Components, Technology and Materials)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/b8900acb-ed6c-4240-8bf2-0c2a0c29b617
More Info
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Publication Year
2005
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Editors onbekend, WPM@en
Pages (from-to)
45-49
ISBN (print)
0-7803-9309-0
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