Capacitance sensitivity calculation for interconnects by adjoint field technique
Conference Paper
(2008)
Author(s)
Y Bi (TU Delft - Old - EWI Sect. Circuits and Systems)
N.P. van der Meijs (TU Delft - Signal Processing Systems)
D. Ioan (External organisation)
Research Group
Old - EWI Sect. Circuits and Systems
DOI related publication
https://doi.org/doi:10.1109/SPI.2008.4558365
To reference this document use:
https://resolver.tudelft.nl/uuid:b996f879-900a-4177-bcc2-044b88f02fb6
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Publication Year
2008
Research Group
Old - EWI Sect. Circuits and Systems
Pages (from-to)
1-4
ISBN (print)
1-4244-2317-0
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