Experimental characterisation of roughness induced scattering loss in Si and SiC waveguide sensors
Conference Paper
(2009)
Author(s)
E Margallo (TU Delft - Electronic Instrumentation)
C. Yang (TU Delft - Electronic Instrumentation)
G. Pandraud (TU Delft - Electronic Components, Technology and Materials)
Paddy French (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:bd99b0db-7f00-47dd-a8df-e06d1c65d513
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Publication Year
2009
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
1557-1561
ISBN (print)
978-1-4244-5335-1
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