Experimental characterisation of roughness induced scattering loss in Si and SiC waveguide sensors

Margallo, E; Yang, CK; Pandraud, G; French, P.J.

Experimental characterisation of roughness induced scattering loss in Si and SiC waveguide sensors

Conference paper (2009)

Authors

E Margallo Electronic Instrumentation

CK Yang Electronic Instrumentation

G Pandraud Electronic Components, Technology and Materials

P.J. French Electronic Instrumentation

Research Group

Electronic Instrumentation

To reference this document use:

http://resolver.tudelft.nl/uuid:bd99b0db-7f00-47dd-a8df-e06d1c65d513

More Info

expand_more

Published Date

2009

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Electronic Instrumentation

No files available

Metadata only record. There are no files for this conference paper.