A PoF and statistics combined reliability prediction for LED arrays in lamps
Bo Sun (State Key Laboratory of Solid State Lighting, TU Delft - Electronic Components, Technology and Materials)
Xuejun Fan (State Key Laboratory of Solid State Lighting, Lamar University)
Jiajie Fan (Hohai University)
G.Q. Zhang (TU Delft - Electronic Components, Technology and Materials, Chinese Academy of Sciences)
Cheng Qian (Chinese Academy of Sciences, State Key Laboratory of Solid State Lighting)
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Abstract
In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation conditions of the entire LED array. A physics-of-failure based reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and the catastrophic failure. Electronic-thermal simulations are utilized to obtain operation conditions, including temperature and current. Meanwhile, statistical models are applied to calculate possibilities of the catastrophic failure in different operation conditions.