A PoF and statistics combined reliability prediction for LED arrays in lamps

Conference paper (2017)

Authors

B. Sun State Key Laboratory of Solid State Lighting, Electronic Components, Technology and Materials - EEMCS
Xuejun Fan State Key Laboratory of Solid State Lighting, Lamar University
J. Fan Hohai University
Kouchi Zhang Chinese Academy of Sciences, Electronic Components, Technology and Materials - EEMCS
Cheng Qian Chinese Academy of Sciences, State Key Laboratory of Solid State Lighting
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
Copyright: © 2017 B. Sun, Xuejun Fan, J. Fan, Kouchi Zhang, Cheng Qian
DOI
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https://doi.org/10.1109/EuroSimE.2017.7926264
Reliability MOSFET Electrolytic Capacitor-Free LED Driver
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Published Date

2017

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials

Abstract

In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation conditions of the entire LED array. A physics-of-failure based reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and the catastrophic failure. Electronic-thermal simulations are utilized to obtain operation conditions, including temperature and current. Meanwhile, statistical models are applied to calculate possibilities of the catastrophic failure in different operation conditions.