The Pessimistic Limits and Possibilities of Margin-based Losses in Semi-supervised Learning
J.H. Krijthe (Radboud Universiteit Nijmegen)
M Loog (University of Copenhagen, TU Delft - Pattern Recognition and Bioinformatics)
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Abstract
Consider a classification problem where we have both labeled and unlabeled data available. We show that for linear classifiers defined by convex margin-based surrogate losses that are decreasing, it is impossible to construct any semi-supervised approach that is able to guarantee an improvement over the supervised classifier measured by this surrogate loss on the labeled and unlabeled data. For convex margin-based loss functions that also increase, we demonstrate safe improvements are possible
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