The Pessimistic Limits and Possibilities of Margin-based Losses in Semi-supervised Learning

Conference Paper (2018)
Author(s)

J.H. Krijthe (Radboud Universiteit Nijmegen)

M Loog (University of Copenhagen, TU Delft - Pattern Recognition and Bioinformatics)

Research Group
Pattern Recognition and Bioinformatics
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Publication Year
2018
Language
English
Research Group
Pattern Recognition and Bioinformatics
Pages (from-to)
1793-1802

Abstract

Consider a classification problem where we have both labeled and unlabeled data available. We show that for linear classifiers defined by convex margin-based surrogate losses that are decreasing, it is impossible to construct any semi-supervised approach that is able to guarantee an improvement over the supervised classifier measured by this surrogate loss on the labeled and unlabeled data. For convex margin-based loss functions that also increase, we demonstrate safe improvements are possible

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