Cross section by focussed ion beam of in-situ induced phase transformed zones at grain boundaries in Cu3Au TEM foils
Poster
(2003)
Author(s)
H Mohdadi (TU Delft - QN/High Resolution Electron Microscopy)
VGM Sivel (TU Delft - OLD Virtual Materials and Mechanics)
Frans Tichelaar (TU Delft - QN/High Resolution Electron Microscopy)
H.W. Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
QN/High Resolution Electron Microscopy
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https://resolver.tudelft.nl/uuid:c4495285-3411-4def-a6c0-9ca01c123d11
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Publication Year
2003
Research Group
QN/High Resolution Electron Microscopy
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