Cross-Correlated Contrast Source Inversion
S Sun (TU Delft - Microwave Sensing, Signals & Systems)
Bert Kooij (TU Delft - Microwave Sensing, Signals & Systems)
Tian Jin (National University of Defense Technology)
A Yarovyi (TU Delft - Microwave Sensing, Signals & Systems)
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Abstract
In this paper, we improved the performance of the contrast source inversion (CSI) method by incorporating a so-called cross-correlated cost functional, which interrelates the state error and the data error in the measurement domain. The proposed method is referred to as the cross-correlated CSI. It enables better robustness and higher inversion accuracy than both the classical CSI and multiplicative regularized CSI (MR-CSI). In addition, we show how the gradient of the modified cost functional can be calculated without significantly increasing the computational burden. The advantages of the proposed algorithms are demonstrated using a 2-D benchmark problem excited by a transverse magnetic wave as well as a transverse electric wave, respectively, in comparison with classical CSI and MR-CSI.