Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique
Conference Paper
(2011)
Author(s)
Y Bi (TU Delft - Signal Processing Systems)
S de Graaf (TU Delft - Signal Processing Systems)
N.P. van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
DOI related publication
https://doi.org/10.1109/CICC.2011.6055331
To reference this document use:
https://resolver.tudelft.nl/uuid:c5e2aab0-a4f0-44ee-96de-38f46966299a
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Publication Year
2011
Language
English
Research Group
Signal Processing Systems
Pages (from-to)
1-4
ISBN (print)
9781457702228
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