A cryogenic, coincident fluorescence, electron and ion beam microscope

Journal Article (2022)
Author(s)

Daan B. Boltje (Delmic BV, TU Delft - ImPhys/Microscopy Instrumentation & Techniques)

J. P. Hoogenboom (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)

A. Jakobi (TU Delft - BN/Arjen Jakobi Lab, Kavli institute of nanoscience Delft)

Grant J. Jensen (California Institute of Technology, Brigham Young University)

C.T.H. Jonker (TU Delft - ImPhys/Microscopy Instrumentation & Techniques, Delmic BV)

Max J. Kaag (Student TU Delft)

C. de Agrela Pinto (Kavli institute of nanoscience Delft, TU Delft - BN/Arjen Jakobi Lab)

Ernest B. van der van der Wee (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)

Sander den Hoedt

More Authors (External organisation)

Research Group
ImPhys/Microscopy Instrumentation & Techniques
Copyright
© 2022 D.B. Boltje, J.P. Hoogenboom, A. Jakobi, Grant J. Jensen, C.T.H. Jonker, Max J. Kaag, C. de Agrela Pinto, E.B. van der Wee, Sander Den Hoedt, More Authors
DOI related publication
https://doi.org/10.7554/eLife.82891
More Info
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Publication Year
2022
Language
English
Copyright
© 2022 D.B. Boltje, J.P. Hoogenboom, A. Jakobi, Grant J. Jensen, C.T.H. Jonker, Max J. Kaag, C. de Agrela Pinto, E.B. van der Wee, Sander Den Hoedt, More Authors
Research Group
ImPhys/Microscopy Instrumentation & Techniques
Volume number
11
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Abstract

Cryogenic electron tomography (cryo-ET) combined with sub-tomogram averaging, allows in-situ visualization and structure determination of macromolecular complexes at sub-nanometre resolution. Cryogenic focused ion beam (cryo-FIB) micromachining is used to prepare a thin lamella-shaped sample out of a frozen-hydrated cell for cryo-ET imaging, but standard cryo-FIB fabrication is blind to the precise location of the structure or proteins of interest. Fluorescence-guided focused ion beam (FIB) milling at target locations requires multiple sample transfers prone to contamination, and relocation and registration accuracy is often insufficient for 3D targeting. Here, we present in-situ fluorescence microscopy-guided FIB fabrication of a frozen-hydrated lamella to address this problem: we built a coincident 3-beam cryogenic correlative microscope by retrofitting a compact cryogenic microcooler, custom positioning stage, and an inverted widefield fluorescence microscope (FM) on an existing focused ion-beam scanning electron microscope (FIB-SEM). We show FM controlled targeting at every milling step in the lamella fabrication process, validated with transmission electron microscope (TEM) tomogram reconstructions of the target regions. The ability to check the lamella during and after the milling process results in a higher success rate in the fabrication process and will increase the throughput of fabrication for lamellae suitable for high-resolution imaging.