Re-scan confocal microscopy (RCM) improves the resolution of confocal microscopy and increases the sensitivity
Journal Article
(2017)
Author(s)
Giulia De Luca (Universiteit van Amsterdam)
Ronald Breedijk (Universiteit van Amsterdam)
R Hoebe (Universiteit van Amsterdam)
S Stallinga (TU Delft - ImPhys/Quantitative Imaging)
Erik Manders (Universiteit van Amsterdam)
Research Group
ImPhys/Quantitative Imaging
DOI related publication
https://doi.org/10.1088/2050-6120/5/1/015002
To reference this document use:
https://resolver.tudelft.nl/uuid:c643bae6-4a09-40c7-b1c3-e990f69c31d4
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Publication Year
2017
Language
English
Research Group
ImPhys/Quantitative Imaging
Issue number
1
Volume number
5
Pages (from-to)
1-11
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