Re-scan confocal microscopy (RCM) improves the resolution of confocal microscopy and increases the sensitivity
Journal Article
(2017)
Author(s)
Giulia De Luca (Universiteit van Amsterdam)
Ronald Breedijk (Universiteit van Amsterdam)
Ron Hoebe (Universiteit van Amsterdam)
S. Stallinga (TU Delft - ImPhys/Quantitative Imaging)
Erik Manders (Universiteit van Amsterdam)
Research Group
ImPhys/Quantitative Imaging
DOI related publication
https://doi.org/10.1088/2050-6120/5/1/015002
To reference this document use:
https://resolver.tudelft.nl/uuid:c643bae6-4a09-40c7-b1c3-e990f69c31d4
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Publication Year
2017
Language
English
Research Group
ImPhys/Quantitative Imaging
Issue number
1
Volume number
5
Pages (from-to)
1-11
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